STUDI ANALISIS DATA DIFRAKSI SINAR-X PADA MATERIAL ZIRCON PASIR ALAM MELALUI METODE RIETVELD
DOI:
https://doi.org/10.24252/jft.v9i1.25470Abstract
ZrSiO4 (zircon) material derived from natural sand has been successfully synthesized to produce single crystals. Structural analysis and phase change were studied by X-Ray diffraction. Rietveld analysis was carried out as a method of analyzing X-Ray Diffraction data. Zircon with a tetragonal crystal structure has been successfully synthesized to produce single crystals of ZrSiO4 with space group I41/amd. The results of the Rietveld analysis of single crystal ZrSiO4 samples with a tetragonal structure obtained lattice parameters a= 6.602727 (323) c= 5.978810 (317) with a crystal size distribution of 527.033 (0) nm and macrostrains of 0.001x10-4.
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References
Callister, W.D., Rethwisch, D.G., 2010. Materials Science and Engineering: An Introduction. John Wiley & Sons Canada, Limited.
Cullity, B.D., 1978. Elements of X-ray Diffraction. Addison-Wesley Publishing Company.
Leng, Y., 2009. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. John Wiley & Sons.
West, A.R., 1987. Solid State Chemistry and Its Applications. John Wiley & Sons.
Young, R.A., 1993. The Rietveld Method, IUCr Monographies of Crystallography 5. Wiley, Oxford
Cullity, B.D., 1978. Elements of X-ray Diffraction. Addison-Wesley Publishing Company.
Leng, Y., 2009. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. John Wiley & Sons.
West, A.R., 1987. Solid State Chemistry and Its Applications. John Wiley & Sons.
Young, R.A., 1993. The Rietveld Method, IUCr Monographies of Crystallography 5. Wiley, Oxford
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Published
2022-08-30
How to Cite
Rani, S. R. A. (2022). STUDI ANALISIS DATA DIFRAKSI SINAR-X PADA MATERIAL ZIRCON PASIR ALAM MELALUI METODE RIETVELD. JFT: Jurnal Fisika Dan Terapannya, 9(1), 16–22. https://doi.org/10.24252/jft.v9i1.25470
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